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O 1s xps
O 1s xps









Polymers known as: poly-acetal, poly-acrylonitrile Resolution spectra, and atom % data tables from Pp 141-149, 1995.) The standard deviation for BEs from the XI Library of Monochromatic XPS Spectra was 15 repetitive cycles of high energy resolutionĬ 1s high energy resolution spectra, O 1s spectra, other principal signal high energy Recent NIST study to determine "reliable"īinding energies of the principal XPS signals of eachĮlement (C.J.Powell, Applied Surface Science, Vol. Spectra in this handbook were used as part of a Together with rough BE values of those strong The wide scan spectra are labeled and tabulated All high energy resolution spectraĪre peak-fitted to reveal FWHM, and peak separationįor spin-orbit pairs. Rh, Ru, S, Sb, Sc, Se, Si, Sm, Sn, Sr (2+), Ta, Tb, The X-Probe, M-Probe, and S-Probe XPS SystemsĮnergy resolution spectra for the elements Ag, Al,Īr(+), As, Au, B, Ba(+), Be, Bi, Br (-), C, Ca (2+),Ĭd, Ce (4+), Cl (-), Co, Cr, Cs (+), Cu, Dy, Er, Eu,į (-), Fe, Ga, Gd, Ge, Hf, Hg, Ho, I (-), In, Ir, K Sensitivity Factors used for Atom% Calculations Pure Metals to Non-Conductive Binary Oxides Source of Commercially Pure Binary Oxidesĭistance between the Sample and the ElectronĬrude Tests of the Reliability of Relative Sensitivity Total number of pages in the complete set of The table provides signal label, corrected BE, experimental BE, corrected RSF, normalized peak area, relative peak area and atom % values. Results from processing the survey spectrum. The first page of each spectra-set provides a chemical formula at the top right, a CAS number, original file-name, sample description, special details about sample handling, sample preparation, ion etching if done, charge control methods used, the date of the analysis and then a detailed table of of the Printed on each high energy resolution spectrum. (BEs), FWHMs and relative signal percentages are % tables that report BEs for each of the labeled The XPS signals in the wide scan survey spectra areįully annotated and are accompanied by detailed atom Methods, traceability, energy scale calibrationĭetails, and transmission function are all reported. Instrument characteristics, energy referencing Page in landscape format in loose-leaf, hard coverīinders. The spectra are presented one spectrum per Instrument and the methods used to collect the

o 1s xps

Includes comprehensive information about the Loose-leaf binders, landscape layout, 3 copies permitted).

#O 1S XPS SERIES#

Monochromatic XPS Spectra - 5 Volume Series In one related experiment in this laboratory with MnO heated to 600☌ for 12 h, there was no significant change in the higher BE component ascribed to defective oxide, indicating little or no surface hydroxides are present.E-mail: VOLUME SERIES of XPS SPECTRAL HANDBOOKS Pure oxide samples were not heated to remove possible surface hydroxides before analysis to avoid reduction of the oxide. Inspection of the C 1s spectrum should confirm if this is occurring. It should be noted that this second peak could result from carbonates species. These contributions from defective sites are unlikely to compromise the assignment of chemical states. For all of the oxides studied here this peak has an area contribution between 20 and 40 % consistent with other powdered oxides including nickel and chromium. Other work has shown that this is a defective oxide peak and not hydroxide as the presence of hydroxide has been ruled out by other methods. For many of the pure oxide samples there is a second higher BE peak that can be ascribed to contributions from a defective oxide component inherent in these oxide surfaces as suggested previously10.









O 1s xps